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Re:TCXO Failure Analysis by JanoMartinez on Tuesday March 10, 2026 @10:49AM (#47324035)
Interesting thread.

I had heard similar cautions about ultrasonic cleaning with certain MEMS sensors, but I didn't realize the same concern could apply to exposed-die CMOS sensors as well.

Is the main risk the resonance frequencies of the bond wires, or more about mechanical stress propagating through the package?

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