Re:TCXO Failure Analysis
by JanoMartinez on Tuesday March 10, 2026 @10:49AM
(#47324035)
Interesting thread.
I had heard similar cautions about ultrasonic cleaning with certain MEMS sensors, but I didn't realize the same concern could apply to exposed-die CMOS sensors as well.
Is the main risk the resonance frequencies of the bond wires, or more about mechanical stress propagating through the package?
I had heard similar cautions about ultrasonic cleaning with certain MEMS sensors, but I didn't realize the same concern could apply to exposed-die CMOS sensors as well.
Is the main risk the resonance frequencies of the bond wires, or more about mechanical stress propagating through the package?