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Re:Boston Dynamics Spot Measured Background Radiation in Che... by lnsru on Sunday October 25, 2020 @05:34AM (#24884996)
Computers fail first because the memory content gets corrupted. I can imagine, that power electronics will continue functioning despite radiation.
Re:Boston Dynamics Spot Measured Background Radiation in Che... by magicalhippo on Sunday October 25, 2020 @06:25AM (#24885223)
Apparently regular MOSFETs are affected[1] by the total dose of ionizing radition (TDI) causing important parameters to change, such as threshold voltage (Vgt) and internal resistance (Rds).

So it seems even power electronics are not safe[2], nor microcontrollers/microprocessors and other types of ICs.

[1]: https://nepp.nasa.gov/files/28954/2017-Lauenstein-NSREC-Post... (esp. figure 11)

[2]: https://www.renesas.com/eu/en/products/space-harsh-environme...

Re:Boston Dynamics Spot Measured Background Radiation in Che... by lnsru on Monday October 26, 2020 @12:51AM (#24892922)
Thank you, signed for Renesas newsletter. Very interesting topics.