Re:Rowhammer-test – Test DRAM for bit flips caused by the ro...
by wolf550e on Sunday January 22, 2017 @12:33PM
(#13456098)
Even more enhancement in newer versions:
"Version 7.0 20/July/2016
New Features
Row Hammer Test (Test 13) now uses double-sided hammering and random data patterns in an attempt to expose more RAM modules susceptible to disturbance errors."
"Version 7.0 20/July/2016
New Features Row Hammer Test (Test 13) now uses double-sided hammering and random data patterns in an attempt to expose more RAM modules susceptible to disturbance errors."