Re:Rowhammer-test – Test DRAM for bit flips caused by the ro...
by wolf550e on Sunday January 22, 2017 @12:33PM
(#13456098)
Even more enhancement in newer versions:
"Version 7.0 20/July/2016
New Features Row Hammer Test (Test 13) now uses double-sided hammering and random data patterns in an attempt to expose more RAM modules susceptible to disturbance errors."
"Version 6.0.0 13/Feb/2015
New Features
New "Hammer Test" for detecting disturbance errors caused by charge leakage when repeatedly accessing addresses in the same memory bank but different rows in a short period of time."
http://www.memtest86.com/support/ver_history.htm