Re:How a Norco case killed 13TB of our data
by omgtehlion on Saturday November 03, 2012 @02:59PM
(#4737544)
> Er, I should say "tested at 0.6A" MOSFETs
yes, that would be better. in reality parameters of transistors vary. but when it is off by an order of magnitude these parts (and actually the whole batch) go to trash.
> trace to the gate blew up
if it really was trace to the _gate_ then it might be blown after mosfet itself melted. Because even really fat FETs (with high gate capacity, D-S rated to hundreds of amperes) cannot do this to copper trace.
yes, that would be better. in reality parameters of transistors vary. but when it is off by an order of magnitude these parts (and actually the whole batch) go to trash.
> trace to the gate blew up
if it really was trace to the _gate_ then it might be blown after mosfet itself melted. Because even really fat FETs (with high gate capacity, D-S rated to hundreds of amperes) cannot do this to copper trace.