Re:Fast
by rablackburn on Thursday July 31, 2025 @12:22AM
(#44742280)
> I have found that the old-fashioned “measure twice, cut once” approach is highly destructive. It was how I was trained, so walking away from it was scary.
To be fair it’s great advice when you’re dealing with atoms.
Mutable patterns of electrons, not so much (:
I think the results are excellent, but I can hit a lot of dead ends, on the way. I just spent several days, trying out all sorts of approaches to PassKeys/WebAuthn. I finally settled on an approach that I think will work great.
I have found that the old-fashioned “measure twice, cut once” approach is highly destructive. It was how I was trained, so walking away from it was scary.