Re:‘Better Yield on 5nm Than 7nm’: TSMC Update on Defect Rat...
by 55873445216111 on Tuesday August 25, 2020 @11:01AM
(#24272009)
It sounds like you are conflating "Defect Density" and "Yield". These are not the same. Yield is a function of Defect Density. The function is exponential. Even the appearingly "slight" improvement shown in the Defect Density shown in graph is significant in terms of Yield.
It is amazing to me that we can achieve such low defect rates on projects so complicated as highly brain-insecure sticks of meat that evolved to hunt and forage. Under the principle of radical skepticism the true defect rates could be much higher.