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A comment on Rowhammer-test – Test DRAM for bit flips caused by the rowhammer problem (2015). Parent comment

Re:Rowhammer-test – Test DRAM for bit flips caused by the ro... by yuhong on Sunday January 22, 2017 @08:17PM (#13458897)
If you read the paper, you will notice that Micron is the worst here.
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