News for hackers. Stuff that matters.

A comment on Rowhammer-test – Test DRAM for bit flips caused by the rowhammer problem (2015). Parent comment

Re:Rowhammer-test – Test DRAM for bit flips caused by the ro... by r721 on Sunday January 22, 2017 @08:00AM (#13454984)
And even "cause bit flips in data that gets written back to disc". I think MemTest86's "create bootable CD/USB for testing" approach is safer.
[ Parent | on HN ]

There are no comments on this comment yet.